> X-Ray Photoelectron Spectroscopy (XPS)

Model : VG Escalab 220i XL

 

Role of the equipment

   Chemical analysis of the surface (qualitative and quantitative).
   Allow the study of the chemical bond and the electronic structure of the matter.

 

Technical specifications

• Twin polychromatic source :
- Aluminium Kα1,2 (hν = 1486.6eV)
- Magnésium Kα1,2 (hν = 1253.6eV)
→ resolution for the Ag3d5/2 peak = 1.0eV
• Aluminium monochromatic source Kα1,2 (hν = 1486.6eV)
→ resolution for the Ag3d5/2 peak = 0.6eV
• XL magnetic lens
• Charge compensation for non-conductive sample
• Ion beam etch of Argon (0.1 to 10keV), etching rate between 0.1 and 3nm/min
• Vacuum system :
- Main chamber : 10-10 mbar
- Preparation chamber : 10-9 mbar

 

Accessories

• UV source for UPS measurements
• Preparation chamber and fast entry lock
• Electrochemical cell for in-situ XPS measurements

 

Examples of available processes and services

• Angle resolved measurements (ARXPS)
• XPS Imaging (resolution < 10 µm)
• Depth profil of the species

 

 

 

Contact : Catalin Harnagea