Model : Bruker D8 Advance
Role of the equipment
Cristalline structure analysis in grazing incidence and in Bragg-Brentano incidence for polycristallin samples. In-situ measurements under controled atmosphere, pressure and temperature.
• CuKα X-Rays source, λ = 1.542 Å
• Anton Paar XRK900 owen for controlled temperature (Tambiant à 900ºC), pressure (1 mbar à 10 bars) et atmosphere in-situ measurements
Examples of available processes and services
• Bragg-Brentano measurements for powders and grazing incidence measurements for thin layer.
Contact : Julie Gaudet