Manufacturer : Metricon
Role of the equipment
The metricon 2010 is a plateform for the measurement of thin film optical properties.
• Optical index measurement with high accuracy (±0.001 for the index, ±0.5% for the thickness)
• Measurement as a function of temperature (25 to 150°C)
Examples of available processes and services
• Measurement of the electro-optic properties of a thin-film material
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