> Dynamic Transmission Electron Microscope (DTEM)

Model : Jeol JEM-2100 Plus

 

Role of the Equipment

Transmission Electron Microscopy (TEM) combined with two nanosecond lasers for dynamic analysis.
 

Technical specifications

• Electron gun: - LaB6 emitter

                         - Accelerating voltage: 100 kV to 200 kV

• Resolution: in transmission mode = 0.14 nm at 200 kV
 
• Magnification: x30 to x18,000,000
 

Accessories

• Ultrascan1000 camera from Gatan
 

Examples available processes and services

• Ultrathin sample observations (< 100 nm)
• Dynamic analysis (temporal resolution ~ ns and spatial resolution > 1 nm)

 

 

 

Contact : Patrick Soucy