> Ultrafast Transmission Electron Microscope (UTEM)

Model : Jeol JEM-2100 Plus

 

Role of the Equipment

Transmission Electron Microscopy (TEM) combined with an ultrafast femtosecond laser for ultrafast dynamic analysis.
 
Chemical characterization by Electron Energy Loss Spectroscopy (EELS).
 

Technical specifications

• Electron gun: - LaB6 emitter

                         - Accelerating voltage: 60 kV to 200 kV

• Resolution: - in trasnmission mode = 0.14 nm at 200 kV
                      - in scanning transmission mode= 2.0 nm at 200 kV
 
• Magnification: x30 to x18,000,000
 

Accessories

• Gif from Gatan (EELS, EFTEM, STEM)
• Orius and Ultrascan1000 cameras from Gatan
 

Examples available processes and services

• Ultrathin sample observations (< 100 nm)
• Elemental analysis with EELS and EFTEM
• Ultrafast dynamic analysis (temporal resolution ~ 1 ps and spatial resolution > 1 nm)

 

 

 

Contact : Patrick Soucy