Dynamic Transmission Electron Microscope (DTEM)

Model :

Jeol JEM-2100 Plus

Transmission Electron Microscopy (TEM) combined with two nanosecond lasers for dynamic analysis.

• Electron gun: – LaB6 emitter

– Accelerating voltage: 100 kV to 200 kV

• Resolution: in transmission mode = 0.14 nm at 200 kV
• Magnification: x30 to x18,000,000

• Ultrascan1000 camera from Gatan

• Ultrathin sample observations (< 100 nm)
• Dynamic analysis (temporal resolution ~ ns and spatial resolution > 1 nm)

patrick.soucy@inrs.ca