The probe station Alessi 4500 allows positionning of probes with a precision close to 10 microns on various samples in order to do electrical measurements on micro-circuits.
• DC electrical measurements
• Measurements with up to 8 micro-probes
• Substrates: from small pieces up to 125 mm wafers
• Black chamber for low current measurements
• Diode I-V curve measurement
• Transistors mobility curve measurement
