[List of equipements]
Nanomaterial characterization:
- X-Ray and Hard X-Ray Photoelectron Spectroscope (XPS/HAXPES), PHI Quantes
- High resolution X-ray Diffraction (HR-XRD), Panalytical X-Pert PRO MRD
- X-ray Diffraction (XRD), Panalytical X-Pert PRO MRD
- X-ray Diffraction (XRD), Bruker D8 Advance
Microscopy:
- Dynamic Transmission Electron Microscope (DTEM), Jeol JEM-2100 Plus
- Ultrafast Transmission Electron Microscope (UTEM), Jeol JEM-2100 Plus
- Focused Ion Beam and Scanning Electron Microscope (FIB/SEM), Tescan LYRA 3 XMH
- Scanning Probe Microscope (AFM / STM), Veeco Multimode (Digital Instruments)
- Scanning Probe Microscope (AFM), Veeco Enviroscope (Digital Instruments)
- Ultra-High Vacuum Scanning Probe Microscope (SPM), Jeol 4500 UHV AFM/STM
- Variable Temperature UHV STM / AFM Scanning Probe Microscope (SPM) , Omicron Nanotechnology VT UHV STM / AFM
- Atomic Force Microscope (AFM), XE-150 (Park Systems)
- Scanning Electron Microscope (SEM), Tescan Vega3 LMH
- Scanning Electron Microscope (SEM), Jeol JSM-7401F
- Optical Microscope, Nikon Eclipse L200
- Profilometer, Ambios XP2
Nanodevices - Optical characterization:
- Electro-optical characterization of materials
- Optical pulse shaping and characterization
- Linear and non-linear characterization of nanophotonic devices
- Ellipsometer, J.A. Woolam M-2000
- Ellipsometer, J.A. Woolam VVASE
- Prism coupler, Metricon 2010/M
Nanodevices - Electrical characterization:
- Wire-bonder, KS4523
- Probe Station, Alessi 4500
- Probe Station, Cascades Summit 11000
