> Multimode Scanning Probe Microscope (AFM / STM)

Role of the equipment

   A Scanning Probe Microscope (SPM) is an apparatus able to detect the true 3-dimensional topography of a given surface. The surface is in interaction with a sharp tip, this interaction being controlled by an electronic circuit while the tip is scanned across the sample surface. This Multimode system can be configured as a Scanning Tunnelling Microscope (STM) or as a versatile Atomic Force Microscope (AFM). Measurements are performed in ambient atmosphere.

Technical specifications

• Maximum sample size: 15 mm (diameter) 5mm (height).
• Maximum scanning sizes
- (STM): X and Y: 500 nm, Z: 200 nm
- (AFM): X and Y: 10 um, Z: 2.5 um
• Imaging modes:
- STM (current feedback).
- AFM: Contact (deflection feedback), intermittent contact (Tapping). Point spectroscopy in all modes.
• Additional signals available during imaging: friction (in Contact Mode), phase (in Tapping Mode).
• Advanced techniques: Interleave/Lift mode: magnetic force microscopy (MFM).

Accessories

• Fluid cell for STM electrochemistry.

Examples of available processes and services

• Routine characterization of surface topography
• Studies of molecular self-assembly and interactions with the substrate.
• Material contrast through friction (in contact mode) or phase detection (Tapping Mode)