Home » Fiche technique » High resolution X-Rays Diffractometer (HR-XRD Panalytical)
Structure analysis of epitaxial layers. The sample can be moved following Omega, Phi, Psi, X, Y and Z thanks to the 4 circles cradle.
• CuKα1 X-Rays source, l = 1.54056 Å • 4 bounds Hybrid Monochromator (Ge 220, 19 arcsec) • Detector : gas proportionnal • 2 bounds monochromator triple axis (Ge 220, 12 arcsec) • 4 circles cradle : – 2θ = -10º to150º – Ω = -90º to+90º – Φ = 0º to360º – Ψ = -90º to+90º – X and Y : 100 mm displacement – Z : 11 mm displacement
• Epitaxy software
• Reciprocal space mapping (RSM) • Pole figure • Rocking curve
christophe.chabanier@inrs.ca